Instruments and Analytical Methods Common to Nanoscience

Browse Geochemical Analytical Instruments and Techniques

Each of these pages contains information about each instrument or technique including what it is, fundamental principles, how it works, applications, strengths and limitations, sample preparation, data collection, results, and preparation, and if available, literature and teaching activities/resources.

These resources were originally developed under the Integrating Research and Education project.

X-ray Crystallography

Single-crystal X-ray Diffraction--Christine M. Clark, Eastern Michigan University and Barbara L. Dutrow, Louisiana State University
X-ray Powder Diffraction (XRD)--Barbara L. Dutrow, Louisiana State University and Christine M. Clark, Eastern Michigan University

Electron Microbeam

Electron Probe Micro-analyzer (EPMA)--John Goodge, University of Minnesota-Duluth
Scanning Electron Microscopy (SEM)--Susan Swapp, University of Wyoming
Wavelength Dispersive Spectroscopy (WDS)--Darrell Henry, Louisiana State University and John Goodge, University of Minnesota-Duluth
Energy Dispersive Spectroscopy (EDS)--John Goodge, University of Minnesota-Duluth
Back-Scattered Electron Imaging (BSE)--John Goodge, University of Minnesota at Duluth
X-ray Elemental Mapping--John Goodge, University of Minnesota-Duluth
Cathodoluminescence (SEM-CL)--Darrell Henry, Louisiana State University
Electron Back-Scattered Diffraction (EBSD)--Susan Swapp, University of Wyoming
Auger Electron Spectroscopy (AES)-- David Mogk, Montana State University

Elemental Analysis

X-ray Fluorescence (XRF)--Karl Wirth, Macalester College and Andy Barth, Indiana University~Purdue University, Indianapolis
Instrumental Neutron Activation Analysis (INAA)--Nelson Eby, University of Massachusetts Lowell
Using Geochemical Data--Karl Wirth, Macalester College

Mass Spectrometers--Magnetic Sector

Thermal Ionization Mass Spectrometry (TIMS)--Paul Mueller, University of Florida and Jeff Vervoort, Washington State University
Multicollector-Inductively Coupled Plasma Mass Spectrometer (MC-ICPMS)--Jeff Vervoort, Washington State University and Paul Mueller,University of Florida
Secondary Ion Mass Spectroscopy (SIMS)--Paul Mueller, University of Florida and Jeff Vervoort, Washington State University
Gas Source--Steve Dunn, Mount Holyoke College

Micro-Imaging Instruments

Petrographic Microscope
X-ray Computed Tomography (CT)--Richard Ketcham, University of Texas at Austin
Scanning Electron Microscopy (SEM)--Susan Swapp, University of Wyoming
SEM-Cathodoluminescence (SEM-CL)--Darrell Henry, Louisiana State University
Optical Cathodoluminescence (Op-CL)--Darrell Henry, Louisiana State University

Surface Spectroscopies

Time Of Flight-Secondary Ion Mass Spectrometry (ToF-SIMS)--David W. Mogk, Montana State University
Auger Electron Spectroscopy (AES)-- David Mogk, Montana State University
X-ray Photoelectron Spectroscopy-- David Mogk. Montana State University

Other Spectroscopies

Mossbauer Spectroscopy--M. Darby Dyar, Department of Astronomy, Mount Holyoke College
Laser Induced Breakdown Spectroscopy (LIBS)--Nancy McMillan, New Mexico State University

Supporting Information Sheets

Generation of Chracteristic X-rays-- under development
Bragg's Law--Darrell Henry, Louisiana State University; Nelson Eby, University of Massachusetts - Lowell; John Goodge, University of Minnesota - Duluth; and David Mogk, Montana State University
Electron Beam - Sample Interactions--Darrell Henry, Louisiana State University

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