Analytical Geochemical Instrument Database

The following instruments can be searched by keyword or by using the "narrow the view" function on the right side of your screen.

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Analytical Instrument Type Show all

Surface Spectroscopies

ToF-SIMS Time-of-flight secondary ion mass spectrometer 1 match
XPS X-ray photoelectron spectroscopy 2 matches

Current Search Limits:

Results 1 - 3 of 3 matches

XPS X-ray Photoelectron Spectroscopy part of Instrument Collection
Eskişehir Osmangazi University - Department of Chemical Engineering - Eskişehir - ALABAMA -

Time-of-flight secondary ion mass spectrometer part of Instrument Collection
Image and Chemical Analysis Laboratory - Montana State University - Bozeman - MONTANA -

X-ray Photoelectron Spectroscope part of Instrument Collection
Image and Chemical Analysis Laboratory - Montana State University - Bozeman - MONTANA -