Teach the Earth > Petrology > Analytical Geochemical Instrument Registry > Browse Geochemical Instruments > Time-of-flight secondary ion mass spectrometer

Image and Chemical Analysis Laboratory

Montana State University

Contact Information

Dr. Recep Avci

406 994-4199




Instrument Type

SURFACE SPECTROSCOPIES - ToF-SIMS Time-of-flight secondary ion mass spectrometer

Charles Evans & Associates Trift


Surface analysis

Typical Use:

ToF SIMS is used for surface characterization. The molecules and atomics present can be detected and mapped to about 0.5um resolution. Molecular species and atomics of the same atomic mass can easily be distinguished because of the superior mass resolution. Depth profiling of atomics is possible.

Conditions for Use:

Visitors are invited to work in the lab to work with lab personnel.
Visitors are invited to work in the lab to design and do the work yourself.
Training session (short course) is offered.

User Fees:

Contant ICAL for current rates

Instrument Priorities:

ICAL is a university-operated user facility that supports research and education for the academic community as well as the local private sector.

Remote Use:


Sample Preparation:

Samples must be vacuum compatible, small (1cm diameter) and relatively flat. Powders are acceptable.

Standard Collections/Lab Blanks:


Data is acquired and analyzed using the WinCadence software. Images can be output in .jpg format.

Educational Use:

Class demonstrations are available for undergraduates.
Undergraduate student research projects are invited.
Graduate student research projects are invited.

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