The Center for Electron Microscopy and Microanalysis (CEMMA)

University of Southern California

Contact Information

John Curulli

(213) 740-1990

Los Angeles


Instrument Type

  • ELECTRON MICROBEAM - SEM scanning electron microscope (including BSE, back-scattered electron detector)
  • ELECTRON MICROBEAM - EDS energy dispersive spectrometer
  • ELECTRON MICROBEAM - TEM transmission electron microscopy, including SAED small area electron diffraction, and AEM analytical electron microscopy


Typical Use:

Conditions for Use:

Visitors are invited to:
  • work in the lab
  • work with lab personnel
  • work in the lab to design and do the work yourself

User Fees:

Instrument Priorities:

Remote Use:

Sample Preparation:

Standard Collections/Lab Blanks:


Educational Use:

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