Electron Microbeam
University of Illinois
Contact Information
Craig Lundstrom
217 244-6293
lundstro@uiuc.edu
Urbana
ILLINOIS
Instrument Type
ELECTRON MICROBEAM - SEM scanning electron microscope (including BSE, back-scattered electron detector) ELECTRON MICROBEAM - EDS energy dispersive spectrometer
JEOL 840A with 4 PI analysis system
Application:
Typical Use:
Conditions for Use:
Visitors are invited to work in the lab to work with lab personnel.
Visitors are invited to work in the lab to design and do the work yourself.
Visitors are invited to work in the lab to design and do the work yourself.
User Fees:
Nominal contribution for supplies only
Instrument Priorities:
Remote Use:
No
Sample Preparation:
Standard Collections/Lab Blanks:
Set of Smithsonian and oxide standards. Easy, user friendly quantitative EDS analysis.
Software:
Digital imaging and x-ray mapping
Educational Use:
Undergraduate student research projects are invited.
Graduate student research projects are invited.
Graduate student research projects are invited.