Materials Physics Lab
Initial Publication Date: August 29, 2006
University of Dayton Research Institute
http://www.udri.udayton.edu/AerospaceMechanics/ImpactPhysics/Pages/home.aspx
Contact Information
Dr. Andrew W. Phelps
937.229.2793
phelps@saber.udayton.edu
Dayton
OHIO
Instrument Type
ELECTRON MICROBEAM - SEM scanning electron microscope (including BSE, back-scattered electron detector)
ELECTRON MICROBEAM - EDS energy dispersive spectrometer
ELECTRON MICROBEAM - TEM transmission electron microscopy, including SAED small area electron diffraction, and AEM analytical electron microscopy
ELECTRON MICROBEAM - EDS energy dispersive spectrometer
ELECTRON MICROBEAM - TEM transmission electron microscopy, including SAED small area electron diffraction, and AEM analytical electron microscopy
JEOL 1200EX-ASID
Application:
Mineral structure (atomic) Micro-imaging
Typical Use:
Full spectrum EDS mapping with EDAX ultrathin window detector. Semi-quant analysis down to boron. Scanning TEM mode suited to low Z-contrast samples.
Conditions for Use:
Submitted samples will be analyzed on a contract basis (i.e. lab personnel will do the work)
User Fees:
Contract analysis is expensive but contact lab manager for current rates.
Instrument Priorities:
Schedule Priority: 1. Mission Critical US Gov., 2. Critical Industrial, 3. Funded Projects and Visitors
Remote Use:
Sample Preparation:
Uses powdered or specially thinned samples. Typical TEM sample thickness is less than 300 nm. Contact lab manager for details.
Standard Collections/Lab Blanks:
Software:
Emispec State-of-the-Art control, data acquisition, and analysis system. Direct digital image capture in conventional and scanned modes. Film required for electron diffraction.