Scanning Electron Microscope
Initial Publication Date: January 5, 2004
UCSB
http://www.geol.ucsb.edu/faculty/hacker/#facilities
Contact Information
Bradley Hacker
805 893 7952
hacker@geol.ucsb.edu
Santa Barbara
CALIFORNIA
Instrument Type
ELECTRON MICROBEAM - SEM scanning electron microscope (including BSE, back-scattered electron detector)
ELECTRON MICROBEAM - EDS energy dispersive spectrometer
ELECTRON MICROBEAM - EDS energy dispersive spectrometer
JEOL 6300
Application:
Surface analysis Micro-imaging
Typical Use:
characterization of sample morphology
Conditions for Use:
Submitted samples will be analyzed on a contract basis (i.e. lab personnel will do the work).
Visitors are invited to work in the lab to work with lab personnel.
Visitors are invited to work in the lab to design and do the work yourself.
Training Session (short course) is offered.
Visitors are invited to work in the lab to work with lab personnel.
Visitors are invited to work in the lab to design and do the work yourself.
Training Session (short course) is offered.
User Fees:
contact for current rates
Instrument Priorities:
Remote Use:
no
Sample Preparation:
Standard Collections/Lab Blanks:
Software:
Educational Use:
Class demonstrations are available for undergraduates.
Class demonstrations are available for K-12.
Undergraduate student research projects are invited.
Graduate student research projects are invited.
Class demonstrations are available for K-12.
Undergraduate student research projects are invited.
Graduate student research projects are invited.