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Instrumentation Sharing

The ACM FaCE program aims to promote collaboration among faculty at the member institutions. In the sciences, this collaboration may be fostered by the availability of specialized instrumentation available at one institution that may facilitate the research of a faculty member at another institution. A visit to utilize some type of specialized equipment could lead to further advancement of both participants' scholarly efforts.

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NT-MDT Solver Next SPM: Beloit College
STM and AFM modes; Sample size up to 10 mm in diameter; scanning area 100x100 um, resolution ~0.3 nm.

Agilent 7100 Capillary Electrophoresis: Beloit College
Injection Pressure: –100 to +100 mbar, Electrokinetic: –30 to +30 kV; 50-position carousel autosampler; UV-Visible diode-array detector (190–600 nm).

JEOL JSM-5900LV SEM with Oxford INCA200 EDS: Beloit College
Probe current up to uA, optimized resolution ~5 nm, vacuum ~1 Pa, beam energy up to 30 keV.

See Co Fe-57 spectrometer: Knox College
Variable temperature 295K to 25K, 500G perpendicular field

: Knox College
The TEM is a JEOL 100SX and the SEM is an Amray. We also have 2 MT2B ultramicrotomes and a sputter coater and critical point dryer.

Kodak Image Station 4000MM Pro: Beloit College
4 million pixel CCD camera, 10x optical zoom, 10um/pixel resolution.

Nikon Eclipse Ti Invertied Research Fluorescence Microscope: Beloit College
Motorized nosepiece up/down movement, Stroke (motorized): up 7.5mm,down 2.5mm , minimum step: 0.025µm, maximum speed:2.5mm/sec;TI-DS Diascopic Illumination Pillar 30W; Motorized stage cross travel:X110 x Y75mm, ...

Rigaku MiniFlexII XRD: Beloit College
Cu source, vertical Goniometer, -3 – 145 degree, 0.01 – 100 degree/min scanning speed.

240FS AA Fast Sequential Atomic Absorption Spectrometer: Beloit College
With SIPS-10 sample introduction pump system, C2H2/air gas supplies, SpectraAA software.