Center for Electron Microscopy and Analysis (CEMAS)
The Ohio State University
https://cemas.osu.edu/
Contact Information
Sreenivas Bhattiprolu
614 292 2272
bhattiprolu.1@osu.edu
Columbus
OHIO
Instrument Type
ELECTRON MICROBEAM - SEM scanning electron microscope (including BSE, back-scattered electron detector) ELECTRON MICROBEAM - EDS energy dispersive spectrometer Scanning Electron Microscopy / Energy Dispersive X-ray Analysis
JEOL JSM-820
Application:
Micro-imaging
Typical Use:
High resolution topographical imaging with magnifications from 15X to 350,000X and with excellent depth of field.
Compositional imaging and x-ray spot analysis to determine mineral composition with 0.1% detection limits.
High-resolution 3D stereo imaging by rotating the stage along Z-axis.
Linear and aerial concentration profiles based on x-ray maps.
Compositional imaging and x-ray spot analysis to determine mineral composition with 0.1% detection limits.
High-resolution 3D stereo imaging by rotating the stage along Z-axis.
Linear and aerial concentration profiles based on x-ray maps.
Conditions for Use:
Submitted samples will be analyzed on a contract basis (i.e. lab personnel will do the work).
Visitors are invited to work in the lab to work with lab personnel.
Visitors are invited to work in the lab to design and do the work yourself.
Training Session (short course) is offered.
Visitors are invited to work in the lab to work with lab personnel.
Visitors are invited to work in the lab to design and do the work yourself.
Training Session (short course) is offered.
User Fees:
Contact Sreenivas Bhattiprolu (614 292 2272) or John Olesik (614 292 6954) for user fee.
Instrument Priorities:
Remote Use:
Sample Preparation:
Samples need to be dry, free of oil or grease. The samples are usually coated with a thin layer of gold (for imaging) or carbon (for microanalysis). Low voltage operation is possible for samples that need to remain unaltered, i.e. without gold or carbon coating.
Standard Collections/Lab Blanks:
53 (most common) mineral standards are available to match the matrix of the samples for more accurate elemental analysis.
Software:
Oxford ISIS/INCA software for high-resolution imaging, elemental x-ray analysis, linear and aerial elemental x-ray mapping.
Educational Use:
Class demonstrations are available for undergraduates.
Class demonstrations are available for K-12.
Undergraduate student research projects are invited.
Graduate student research projects are invited.
Tutorials and other educational materials related to the lab are available.
Class demonstrations are available for K-12.
Undergraduate student research projects are invited.
Graduate student research projects are invited.
Tutorials and other educational materials related to the lab are available.