Electron Microprobe Laboratory

Initial Publication Date: July 30, 2012

University of Colorado, Boulder

https://cumicroprobelab.org/

Contact Information

Julien Allaz

(303) 735 2413

julien.allaz@colorado.edu

Boulder

COLORADO

Instrument Type

SEM scanning electron microscope
EDS energy dispersive spectrometer
EMPA electron microprobe; wavelength dispersive spectrometers

JEOL JXA-8600

Application:

Micro-imaging

Typical Use:

An electron microprobe is an electron microscope designed for the non-destructive x-ray microanalysis and imaging of solid materials. It is capable of high spatial resolution (1 µm beam size) and relatively high analytical sensitivity. The analytical facilities' JEOL JXA-8600 can acquire digital secondary-electron and backscattered-electron images as well as elemental x-ray maps. It is equipped with 4 wavelength-dispersive spectrometers and an energy-dispersive spectrometer. Most of the periodic table can in principle be analyzed (Be through U), subject to several important considerations.

Conditions for Use:

Submitted samples will be analyzed on a contract basis (i.e. lab personnel will do the work)
Visitors are invited to work in the lab to work with lab personnel
Visitors are invited to work in the lab to design and do the work yourself

User Fees:

Contact lab manager for current rates. Short training (couple hours) can be provided on site if necessary; knowledge of x-ray theory (WDS, EDS, electron microprobe in general) prior to the use of the instrument is desirable.

Instrument Priorities:

Priorities given to funded research; lab visitor, class demonstration and student project are all welcome!

Remote Use:

Sample Preparation:

Sample must be mounted either on round mount (ca. 1 inch) or on a normal thin section (46x27 mm). Samples must be well polished; final polishing using 0.05 µm alumina powder recommended. Sample can be coated (C-coating) on site.