Initial Publication Date: September 14, 2008
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William C. and Ruth Ann Dewel Microscopy Facility

Appalachian State University
http://www.casmifa.appstate.edu/

Contact Information

Dr. Guichuan Hou

(828) 262-2682

houg@appstate.edu

Boone

NORTH CAROLINA

Instrument Type

ELECTRON MICROBEAM - SEM scanning electron microscope (including BSE, back-scattered electron detector) ELECTRON MICROBEAM - EDS energy dispersive spectrometer ELECTRON MICROBEAM - CL cathodoluminescence detector +/- spectrometer ELECTRON MICROBEAM - TEM transmission electron microscopy, including SAED small area electron diffraction, and AEM analytical electron microscopy X-RAY DIFFRACTION - XRD X-ray powder diffractometer FLUID ANALYSIS - Heating freezing microscope stage Confocal Laser Scanning Microscope

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