Analytical Instrument Database

The following instruments can be searched by keyword or by using the "narrow the view" function on the right side of your screen. Additional geochemical instruments may be listed in the On the Cutting Edge Petrology Geochemical Instrument Browse.

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Surface Spectroscopies > XPS X-ray photoelectron spectroscopy

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X-ray Photoelectron Spectroscopy at Imaging and Chemical Analysis Laboratory (ICAL), MSU-Bozeman part of NNCI Instrument Collection
XPS is a surface sensitive method that determines the composition of one or a few atomic monolayers on mineral surfaces. This instrument has "small spot" capabilities down to 30 micron resolution. Applications include: a) Elemental identification and quantification, b) Chemical functional group identification and quantification; c) Chemical state imaging; d) Surface sensitivity; e) Layer-by-layer depth profiling; f) Analysis of insulating and conducting samples.