Analytical Instrument Database
The following instruments can be searched by keyword or by using the "narrow the view" function on the right side of your screen. Additional geochemical instruments may be listed in the On the Cutting Edge Petrology Geochemical Instrument Browse.
Analytical Instrument Type Show all
Analytical Instrument TypeResults 1 - 3 of 3 matches
An Integrated Auger Electron Spectroscopy, EDS and EBSD System at the Imaging and Chemical Analysis Laboratory (ICAL), MSU-Bozeman part of NNCI Instrument Collection
This Phi 710 NanoAuger Probe is a unique analytical system that includes: 1) Field Emission SEM imaging for spatial resolution down to 5 nanometeers; 2) AES detector for surficial compositional analysis for atomic monolayers on surfaces, with detection of light elements down to Li; 3) Ar-beam ion gun for "dusting off" surfaces of environmental contaminants and depth profiling capabilities; 4) EDS detector for "bulk" compositional analysis and X-ray elemental mapping of materials, and 5) EBSD detector for phase identification using electron diffraction and determination of crystallographic orientation. These numerous analytical methods can be used in near-real-time to fully characterize in situ the identity, crystal structure and orientation, bulk composition, and surface composition of sub-micron to micron particles. Charge compensation methods are used to analyze insulating materials because conducting coats cannot be applied to AES samples.
Time of Flight Secondary Ion Mass Spectrometer (ToF-SIMS) at the Imaging and Chemical Analysis Laboratory (ICAL), MSU-Bozeman part of NNCI Instrument Collection
ToF-SIMS is widely used in nano-engineering research on semi-conductors and related microelectronics, polymer, thin film, metallurgy, ceramics, energy, and medical devices. ToF-SIMS has not been widely used in Earth and Environmental Sciences, but applications include documenting thin carbon films on mineral grain boundaries, search for biomarkers in the geologic record, interplanetary dust, evidence of magmatic fluids, and studies of coal macerals.
X-ray Photoelectron Spectroscopy at Imaging and Chemical Analysis Laboratory (ICAL), MSU-Bozeman part of NNCI Instrument Collection
XPS is a surface sensitive method that determines the composition of one or a few atomic monolayers on mineral surfaces. This instrument has "small spot" capabilities down to 30 micron resolution. Applications include: a) Elemental identification and quantification, b) Chemical functional group identification and quantification; c) Chemical state imaging; d) Surface sensitivity; e) Layer-by-layer depth profiling; f) Analysis of insulating and conducting samples.