Analytical Instrument Database

The following instruments can be searched by keyword or by using the "narrow the view" function on the right side of your screen. Additional geochemical instruments may be listed in the On the Cutting Edge Petrology Geochemical Instrument Browse.

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Surface Spectroscopies > ToF-SIMS Time-of-flight secondary ion mass spectrometer

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Time of Flight Secondary Ion Mass Spectrometer (ToF-SIMS) at the Imaging and Chemical Analysis Laboratory (ICAL), MSU-Bozeman part of NNCI Instrument Collection
ToF-SIMS is widely used in nano-engineering research on semi-conductors and related microelectronics, polymer, thin film, metallurgy, ceramics, energy, and medical devices. ToF-SIMS has not been widely used in Earth and Environmental Sciences, but applications include documenting thin carbon films on mineral grain boundaries, search for biomarkers in the geologic record, interplanetary dust, evidence of magmatic fluids, and studies of coal macerals.