Instrumentation Sharing

The ACM FaCE program aims to promote collaboration among faculty at the member institutions. In the sciences, this collaboration may be fostered by the availability of specialized instrumentation available at one institution that may facilitate the research of a faculty member at another institution. A visit to utilize some type of specialized equipment could lead to further advancement of both participants' scholarly efforts.

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Microscopy (SEM, TEM, Confocal)

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JEOL JSM-5900LV SEM with Oxford INCA200 EDS: Beloit College
Probe current up to uA, optimized resolution ~5 nm, vacuum ~1 Pa, beam energy up to 30 keV.

: Knox College
The TEM is a JEOL 100SX and the SEM is an Amray. We also have 2 MT2B ultramicrotomes and a sputter coater and critical point dryer.

Nikon Eclipse Ti Invertied Research Fluorescence Microscope: Beloit College
Motorized nosepiece up/down movement, Stroke (motorized): up 7.5mm,down 2.5mm , minimum step: 0.025µm, maximum speed:2.5mm/sec;TI-DS Diascopic Illumination Pillar 30W; Motorized stage cross travel:X110 x Y75mm, ...