Instrumentation Sharing

The ACM FaCE program aims to promote collaboration among faculty at the member institutions. In the sciences, this collaboration may be fostered by the availability of specialized instrumentation available at one institution that may facilitate the research of a faculty member at another institution. A visit to utilize some type of specialized equipment could lead to further advancement of both participants' scholarly efforts.

View the Collection

Skip to search results Skip to search facet filtersSkip to text search formSkip to pagination

Refine the Results↓

Instrument Type Show all

Microscopy (SEM, TEM, Confocal)

2 matches

Institution Show all

Beloit College

2 matches

Current Search Limits:

Instrument Type

Microscopy (SEM, TEM, Confocal)

Institution

Beloit College

Results 1 - 2 of 2 matches

JEOL JSM-5900LV SEM with Oxford INCA200 EDS: Beloit College
Probe current up to uA, optimized resolution ~5 nm, vacuum ~1 Pa, beam energy up to 30 keV.

Nikon Eclipse Ti Invertied Research Fluorescence Microscope: Beloit College
Motorized nosepiece up/down movement, Stroke (motorized): up 7.5mm,down 2.5mm , minimum step: 0.025µm, maximum speed:2.5mm/sec;TI-DS Diascopic Illumination Pillar 30W; Motorized stage cross travel:X110 x Y75mm, ...