University of Illinois
ELECTRON MICROBEAM - SEM scanning electron microscope (including BSE, back-scattered electron detector) ELECTRON MICROBEAM - EDS energy dispersive spectrometer
JEOL 840A with 4 PI analysis system
Conditions for Use:
Visitors are invited to work in the lab to work with lab personnel.
Visitors are invited to work in the lab to design and do the work yourself.
Nominal contribution for supplies only
Standard Collections/Lab Blanks:
Set of Smithsonian and oxide standards. Easy, user friendly quantitative EDS analysis.
Digital imaging and x-ray mapping
Undergraduate student research projects are invited.
Graduate student research projects are invited.