Cutting Edge > Petrology > Analytical Instrument Registry > Instrument Submission Form

Registry of Geochemical Analytical Equipment

Use the form below to enter your instrument into the database. Please complete a separate entry for each instrument, so that each will appear when the database is searched. Note that the information needs to be uploaded into the database manually, so it will be a week or so before your entry appears on the web pages.

General Contact Information Name of Facility:
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Institution:
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URL:
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Lab Contact Information
To make contact about this facility, or for more information about the instrumentation, please contact
Contact Name:
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Contact Phone:
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Contact Email:
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City:
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State:

Description of Instrument

Type of Instrument: Create an independent record for each instrument in your laboratory. Check more than one instrument below ONLY if they are PART of the SAME SYSTEM, e.g. SEM/BSE/EDS. If you are planning to register more than one instrument in your laboratory, a) fill out the form for the first instrument, b) submit using the button at the bottom of the form, and c) use your "back" button to recover the general information and modify your entries that are specific to a new instrument and submit again.

ELECTRON MICROBEAM

SEM scanning electron microscope (including BSE, back-scattered electron detector)
EDS energy dispersive spectrometer
CL cathodoluminescence detector +/- spectrometer
Cryogenic sample preparation stage
Electron Back-Scattered Diffraction
EMPA electron microprobe; wavelength dispersive spectrometers
TEM transmission electron microscopy, including SAED small area electron diffraction, and AEM analytical electron microscopy

X-RAY DIFFRACTION

XRD X-ray powder diffractometer
X-ray, single crystal diffractometer; e.g. Buerger precession camera
Synchrotron radiation source

WHOLE ROCK ANALYSIS

XRF X-ray Fluorescence
INAA Instrumental Neutron Activation Analysis
ICP Inductively-coupled plasma spectrometer +/- mass spectrometer (ICP-MS) and laser source

MASS SPECTROMETERS

Radiogenic Isotopes
SIMS, Secondary ion mass spectroscopy, or Dynamic SIMS
Stable isotopes
Ion Probe (e.g., SHRIMP or equivalent)

SURFACE SPECTROSCOPIES

ToF-SIMS Time-of-flight secondary ion mass spectrometer
XPS X-ray photoelectron spectroscopy
AES Auger Electron Spectroscopy (or SAM Scanning Auger Microscopy)

OTHER SPECTROSCOPIES

Mossbauer spectroscopy
NMR nuclear magnetic resonance spectroscopy
Raman Spectroscopy
Xray Absorption Spectroscopy, including EXAFS extended X-ray absorption fine structure and XANES X-ray absorption near edge structure
Infrared spectroscopy

FORCE MICROSCOPIES

STM Scanning Tunneling Microscopy
AFM Atomic Force Microscopy

FLUID ANALYSIS

Heating freezing microscope stage
Atomic Absorption spectrometer
Gas Chromatography

OTHER

Thermal Analysis
Confocal Laser Scanning Microscope

OTHER ANALYTICAL TECHNIQUE

List acronym and full name of the technique:
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Manufacturer and Model

Application: Mineral composition
Mineral structure (atomic)
Chemical State
Surface analysis
Whole-rock analysis (major and trace element)
Age determination K-Ar
Age determination Ar-Ar
Age determination Nd-Sm
Age determination U-Pb
Age determination Fission Track
Age determination Cosmogenic
Fluid or gas analysis
Micro-imaging
Provide a brief description of the typical use of this instrument, the types of analyses that may be obtained and applications of the results; e.g. spot analyses to determine mineral composition; characterization of the morphology, bulk composition, and textures of minerals; age determinations.:
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Conditions of Use Submitted samples will be analyzed on a contract basis (i.e. lab personnel will do the work)
Visitors are invited to work in the lab to work with lab personnel
Visitors are invited to work in the lab to design and do the work yourself
Training Session (short course) is offered
Other information about conditions of use:
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Provide details of user fee requirements (e.g. charges for hourly “beam time” staff assistance, expendables; Contact lab manager for current rates)
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Provide details about priorities of use of the instrumentation, eg. funded research, lab visitors, class demonstrations, student projects:
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Is it possible to operate this instrument from a remote location? If so, explain how:
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Provide details about sample preparation that is required: e.g. handling and transport of the sample, size restrictions, pre-analysis treatments, etc.
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Provide details about any standard collections, laboratory blanks, etc. that are used in the operation of this instrument:
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Provide details about related software; data acquisition, processing and presentation; image enhancement; statistical routines, etc. :
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Educational Use of the Lab

Describe any educational uses of this instrumentation
Class demonstrations are available for undergraduates
Class demonstrations are available for K-12
Undergraduate student research projects are invited
Graduate student research projects are invited
Tutorials and other educational materials related to the lab are available
Other details about educational opportunities in the lab, e.g. URLs, class exercises, student projects, etc.:
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Funding Source

Acknowledgments of funding sources, e.g. NSF Grant number, Foundation or Institution support:
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