Initial Publication Date: April 30, 2021
Geosciences Atom Probe Tomography at the University of Alabama
The University of Alabama
https://uageoapt.ua.edu/
Contact Information
Alberto Perez-Huerta
+1 205-348-8382
aphuerta@ua.edu
Tuscaloosa
AL
Instrument Type
CAMECA LEAP 5000 XS
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- Atom Probe Tomography (APT)
- Polishing (microprobe quality, colloidal Si)
- Sample Coating (C, Au, Ir, others)
- Focused Ion Beam (ion milling)
Application:
Applications include:
- Identification of phases
- Composition (elemental) of phases
- Elemental mapping, compositional zoning
- Trace element analysis
- Structure (atomic) of minerals (diffraction methods)
- Surface chemistry (sorption, catalysis)
- Depth profiling (chemical stratigraphy, nanometer scale)
- Dissolution/precipitation of phases
- Imaging (size, shape, morphology)
- Crystallographic orientation
- Distribution in matrix (disseminated, aggregated...)
- Textural relations (intergrowths, overgrowths, epitaxial...)
- Interfaces
Typical Use:
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Conditions for Use:
- Submitted samples will be analyzed on a contract basis (i.e. lab personnel will do the work)
- Visitors are invited to work in the lab to work with lab personnel
User Fees:
The AARC Facility (https://aarc.ua.edu/) is open to all users and details about instrument use, and staff contact details, can be found in the website. For specific application of APT to geological materials, users are recommend to contact Dr. Alberto Perez-Huerta (aphuerta@ua.edu)
Instrument Priorities:
Remote Use:
N/A
Sample Preparation:
See https://uageoapt.ua.edu/apt-step-by-step.html for specifics about sample preparation
Standard Collections/Lab Blanks:
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Software:
See https://uageoapt.ua.edu/apt-step-by-step.html for specifics about data processing
Educational Use:
- Class demonstrations are available for undergraduates
- Class demonstrations are available for K-12
- Graduate student research projects are invited
Support provided by:
For the APT Geosciences research, we greatly acknowledge funding support from the US National Science Foundation (NSF) [EAR #1647012, 1560779, 1402912]