Materials Research Lab, University of California, Santa Barbara
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This site is intended as a brief introduction to some of the common x-ray diffraction techniques used in materials characterization. It is designed for people who are novices in this field but are interested in using the techniques in their research. Topics include x-ray generation and properties, lattice planes and Bragg's Law, powder and thin film diffraction, texture measurement and pole figures, residual stress measurements, small-angle x-ray scattering (SAXS), and x-ray crystallography.
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