Typical forward geometry SIMS/ion microprobe configuration (Cameca IM 6f) showing: 1) negative primary beam source, 2) positive primary beam source, 3) electrostatic lens for primary beam, 4) sample stage and sputtering, 5) electrostatic sector, 6) magnetic sector, 7) collectors, and 8) ion imaging detector. Click image to enlarge.

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Uploaded: Mar3 07

Last Modified: 2007-06-11 16:25:48
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Image courtesy Stanford-USGS Microanalytical facility.
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