Typical forward geometry SIMS/ion microprobe configuration (Cameca IM 6f) showing: 1) negative primary beam source, 2) positive primary beam source, 3) electrostatic lens for primary beam, 4) sample stage and sputtering, 5) electrostatic sector, 6) magnetic sector, 7) collectors, and 8) ion imaging detector. Click image to enlarge.
Image 8452 is a 497 by 497 pixel JPEG
Uploaded:
Mar3 07
