TOF-SIMS Particle-beam interaction

Particle beam interaction using ToF-SIMS. Incident particles bombard the surface liberating single ions (+/-) and molecular compounds.

Image 8382 is a 261 by 355 pixel JPEG
Uploaded: Mar1 07

Last Modified: 2021-04-21 18:41:30
Permanent URL: https://serc.carleton.edu/download/images/8382/tof-sims_particle-beam_interac.jpg

The file is referred to in 3 pages

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
https://serc.carleton.edu/research_education/geochemsheets/techniques/ToFSIMS.html
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
https://serc.carleton.edu/msu_nanotech/methods/ToFSIMS.html
Time of Flight Secondary Ion Mass Spectrometer (ToF-SIMS) at the Imaging and Chemical Analysis Laboratory (ICAL), MSU-Bozeman
https://serc.carleton.edu/msu_nanotech/instruments/243041.html

Provenance
Dave Mogk, Montana State University-Bozeman

Reuse
This item is offered under a Creative Commons Attribution-NonCommercial-ShareAlike license http://creativecommons.org/licenses/by-nc-sa/3.0/ You may reuse this item for non-commercial purposes as long as you provide attribution and offer any derivative works under a similar license.

About

Reuse

Page Text