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Placheta et al. (2013) Fig. 8. Average grain size calculated from SEM images analysis (a) and diffuse reflectance coefficient Rdiff at wavelength λ = 300 nm (black triangles) superimposed on XRR roughness (red circle) for samples deposited at 5–30 % O2/(O2 + Ar) (b).

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Figure from Płacheta, K., Kot, A., Banas-Gac, J., Zając, M., Sikora, M., Radecka, M. and Zakrzewska, K., 2023. Evolution of surface properties of titanium oxide thin films. Applied Surface Science, 608, p.155046. Used under Creative Commons License.
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