Introduction to Atomic Force Microscopy
xa.yimg.com/kq/groups/22739394/1309982848/name/AFM2.ppt

Janelle Gunther, The Imaging Technology Group, Beckman Institute for Advanced Science and Technology, University of Illinois


This 20-slide presentation focuses on several types of scanning microscopy, including atomic force microscopy and scanning tunneling microscopy. The outline discusses different probe types (lateral force, scanning, tapping, magnetic, and contact), phase imaging, and the advantages and disadvantages of different modes of operation. The site also features images of samples using the various types of probes.


Subject: Geoscience:Geology:Mineralogy:Mineral Analysis, Geoscience:Geology:Geochemistry:Geochemical Analysis
Resource Type: Scientific Resources:Overview/Reference Work, Audio/Visual:Images/Illustrations
Topics: Solid Earth:Geochemistry:Geochemical Analysis, Solid Earth:Mineralogy:Mineral Analysis