Typical forward geometry SIMS/ion microprobe configuration (Cameca IM 6f) showing: 1) negative primary beam source, 2) positive primary beam source, 3) electrostatic lens for primary beam, 4) sample stage and sputtering, 5) electrostatic sector, 6) magnetic sector, 7) collectors, and 8) ion imaging detector. Click image to enlarge.
Image 8452 is a 497 by 497 pixel JPEG
Last Modified: 2007-06-11 16:25:48
Permanent URL: http://serc.carleton.edu/download/images/8452/SIMS3.JPG.v2.jpg
The file is referred to in 1 page
Provenance Image courtesy Stanford-USGS Microanalytical facility. Reuse
No information about limits on reusing this item have been recorded. You will need to contact the original creator for permission in cases that exceed fair use (see