Florida Center for Analytical Electron Microscopy

Flordia International University
https://emlab.fiu.edu/

Contact Information

Tom Beasley, Barbara Maloney, or Gautam Sen

305-348-2714 or 305-348-2299

seng@fiu.edu
beasley@fiu.edu
sholbik@fiu.edu


Miami

FLORIDA

Instrument Type

ELECTRON MICROBEAM - SEM scanning electron microscope (including BSE, back-scattered electron detector)
ELECTRON MICROBEAM - EDS energy dispersive spectrometer
ELECTRON MICROBEAM - CL cathodoluminescence detector +/- spectrometer
ELECTRON MICROBEAM - EMPA electron microprobe; wavelength dispersive spectrometers

JXA-8900-R (microprobe) and the JSM-5900-LV (SEM)

Application:

Chemical state surface analysis and micro-imaging

Typical Use:

Spot analyses to determine mineral/material composition; characterization of the morphology
Microstructures of minerals and other materials.

Conditions for Use:

Submitted samples will be analyzed on a contract basis (i.e. lab personnel will do the work).
Visitors are invited to work in the lab to work with lab personnel.
Visitors are invited to work in the lab to design and do the work yourself.
Training Session (short course) is offered.

User Fees:

Check our website. We do make special considerations for University personnel.

Instrument Priorities:

Funded research has top priority. We are VERY flexible.

Remote Use:

Yes. Contact Tom Beasley (305-348-2714).

Sample Preparation:

Standard Collections/Lab Blanks:

Software:

Educational Use:

Class demonstrations are available for undergraduates.
Class demonstrations are available for K-12.
Undergraduate student research projects are invited.
Graduate student research projects are invited.
Tutorials and other educational materials related to the lab are available.


Support provided by:

This instrument was originally purchased with a NSF-MRI grant.