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UMD Scanning Electron Microscope Lab

University of Minnesota, Duluth

Contact Information

Bryan Bandli




Instrument Type

ELECTRON MICROBEAM - SEM scanning electron microscope (including BSE, back-scattered electron detector)
ELECTRON MICROBEAM - EDS energy dispersive spectrometer
ELECTRON MICROBEAM - CL cathodoluminescence detector +/- spectrometer

JEOL JSM-6490LV, Oxford xAct, HKL Nordlys II, Gatan ChromaCL


Micro-imaging and Mineral Analysis

Typical Use:

This instrument is used typically for imaging and microanalysis of geological, biological and manufactured materials. A wide variety of analyses can be performed including: spot analysis to determine material chemistry, element maps (spectral images), color cathodoluminescence imaging, crystal preferred orientation by EBSD, phase identification by combined EDS/EBSD analysis, variable pressure imaging, low temperature imaging using cool stage attachment.

Conditions for Use:

Submitted samples will be analyzed on a contract basis (i.e. lab personnel will do the work). Visitors are invited to work in the lab to work with lab personnel. Visitors are invited to work in the lab to design and do the work yourself. A training session (short course) is offered. Contact Lab Manager for details.

User Fees:

Rates are charged per hour for instrument use, per hour for staff time, and per sample for sample preparation. Contact Lab Manager for current rates.

Instrument Priorities:

We will work to accommodate any user who has a justified research or educational need for the instrumentation, but priority is given to University of Minnesota, Duluth students, faculty and staff. Contact the Lab Manager to discuss potential projects.

Remote Use:

Yes, using VNC software and with coordination of lab staff.

Sample Preparation:

Most samples can be examined with basic sample preparation. Conductive coating by either gold or carbon is available. For EBSD analysis, final polishing is required using colloidal silica. Contact Lab Manager to discuss details of sample preparation and handling.

Standard Collections/Lab Blanks:

Microbeam reference materials are available for standardized chemical analysis and a list can be provided on demand.


JEOL PC-SEM control software for SEM, Oxford INCA Energy250 for EDS data acquisition and processing, HKL Channel5 software for EBSD data acquisition and post-processing, Oxford Synergy software for simultaneous EDS/EBSD data acquisition, Gatan DigitalMicrograph software for color CL image collection and processing, Olympus Soft Imaging Scandium image processing and analysis software.

Educational Use:

Class demonstrations are available for undergraduates. Class demonstrations are available for K-12. Undergraduate student research projects are invited. Graduate student research projects are invited. Tutorials and other educational materials related to the lab are available. Geol5321, Theory and Practice of Scanning Electron Microscopy and X-ray Microanalysis is offered spring semester.
Instrument is available for individual lab sessions for any university course. We also welcome K-12 groups. Contact Lab Manager for details.

Support provided by:

Instrument purchased with funds from NSF Major Research Instrumentation award (NSF award number 0722389).

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