Institute of Meteoritics
University of New Mexico
http://epswww.unm.edu/iom/ProbeLab.html
Contact Information
Mike Spilde
505/277-5430
mspilde@unm.edu
Albuquerque
NEW MEXICO
Instrument Type
ELECTRON MICROBEAM - SEM scanning electron microscope (including BSE, back-scattered electron detector)
ELECTRON MICROBEAM - EDS energy dispersive spectrometer
ELECTRON MICROBEAM - CL cathodoluminescence detector +/- spectrometer
VPSEM-Variable pressure SEM
ELECTRON MICROBEAM - EDS energy dispersive spectrometer
ELECTRON MICROBEAM - CL cathodoluminescence detector +/- spectrometer
VPSEM-Variable pressure SEM
JEOL 5800LV
Application:
Micro-imaging
Typical Use:
High magnification secondary and backscattered electron imaging on rock and other materials and polished thin sections, semiquantitative EDX analysis, cathodoluminescence imaging of polished surfaces
Conditions for Use:
Submitted samples will be analyzed on a contract basis (i.e. lab personnel will do the work).
Visitors are invited to work in the lab to work with lab personnel.
Visitors are invited to work in the lab to design and do the work yourself.
Training Session (short course) is offered.
Visitors are invited to work in the lab to work with lab personnel.
Visitors are invited to work in the lab to design and do the work yourself.
Training Session (short course) is offered.
User Fees:
2004/05 Rates
Acedemic rate: w/operator $65/hr; w/o operator $40/hr (with training)
Non-academic: w/operator $120/hr; w/o operator $80/hr (with training)
Carbon and Au-Pd coating, polished section preparation (for use on "in-house" samples)
Acedemic rate: w/operator $65/hr; w/o operator $40/hr (with training)
Non-academic: w/operator $120/hr; w/o operator $80/hr (with training)
Carbon and Au-Pd coating, polished section preparation (for use on "in-house" samples)
Instrument Priorities:
Training is 4 hours instruction at "w/ operator" rate
Remote Use:
Sample Preparation:
Rocks or other materials up to 2" in height and up to 6" across
Standard Collections/Lab Blanks:
Software:
Automated image acquistion & processing, phase descimination
Educational Use:
Class demonstrations are available for undergraduates.
Class demonstrations are available for K-12.
Undergraduate student research projects are invited.
Graduate student research projects are invited.
Tutorials and other educational materials related to the lab are available.
Class demonstrations are available for K-12.
Undergraduate student research projects are invited.
Graduate student research projects are invited.
Tutorials and other educational materials related to the lab are available.
Support provided by:
NSF & NASA