Materials Physics Lab
University of Dayton Research Institute
Dr. Andrew W. Phelps
ELECTRON MICROBEAM - SEM scanning electron microscope (including BSE, back-scattered electron detector)
ELECTRON MICROBEAM - EDS energy dispersive spectrometer
ELECTRON MICROBEAM - TEM transmission electron microscopy, including SAED small area electron diffraction, and AEM analytical electron microscopy
Mineral structure (atomic) Micro-imaging
Full spectrum EDS mapping with EDAX ultrathin window detector. Semi-quant analysis down to boron. Scanning TEM mode suited to low Z-contrast samples.
Conditions for Use:
Submitted samples will be analyzed on a contract basis (i.e. lab personnel will do the work)
Contract analysis is expensive but contact lab manager for current rates.
Schedule Priority: 1. Mission Critical US Gov., 2. Critical Industrial, 3. Funded Projects and Visitors
Uses powdered or specially thinned samples. Typical TEM sample thickness is less than 300 nm. Contact lab manager for details.
Standard Collections/Lab Blanks:
Emispec State-of-the-Art control, data acquisition, and analysis system. Direct digital image capture in conventional and scanned modes. Film required for electron diffraction.